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Learn About the 53100A


The 53100A measures the amplitude, phase and frequency stability of high-performance RF sources. It tells you everything you need to know about the stability characteristics of your devices at timescales ranging from femtoseconds to days. The 53100A can be used on a bench-top or embedded into rackmount Automated Test Equipment (ATE) systems. Its small form factor and industry-leading measurement speed makes this test set versatile for multiple applications.

Expanding upon the heritage of the 3120A and 51XXA series of instruments, the 53100A makes fast yet accurate Single Side Band (SSB) phase noise and Allan Deviation (ADEV) measurements at a fraction of the cost of other solutions. Featuring an improved design and advancements in manufacturing, the 53100A offers improvements in reliability and performance over predecessor technologies.

53100A Phase Noise Analyzer Chart


Key Features


  • Internal Reference (IR) options for OCXOs and atomic clocks
  • ADEV typically less than 5E–15 at t = 1s; 1E–16 at t = 1000s
  • Measures up to three devices simultaneously
  • Close-to-carrier phase noise and AM noise at offsets from 0.001 Hz
  • Single- or dual-reference oscillator inputs allow cross-correlation measurements with noise floor approaching −175 dBc/Hz
  • Modified Allan Deviation (MDEV), Hadamard Deviation (HDEV) and Time Deviation (TDEV)
  • Jitter, residual FM and SSB carrier/noise ratio
  • Independent input and reference frequencies from 1 to 200 MHz
  • No phase locking or measurement calibration required

53100A Test Set Video

Watch this short video to learn about the capabilities of the 53100A Phase Noise Analyzer with internal reference capabilities.

Available Models


Model Part Number Description
090-53100-000 53100A Phase Noise Analyzer, Base Configuration
090-53100-001 53100A With IR Option
090-53100-002 53100A With IR and STD Options

Need Some Help?


We are here to support you. Contact our Client Success Team to get assistance with the audio and voice requirements of your design.











Documentation


Title
AN3526 - Dual Reference Noise and Stability Measurements with the 53100A Phase Noise Analyzer Download
Oscillator Measurement and Calibration with the 53100A Phase Noise Analyzer Download
UHF and Microwave Measurements with the 53100A Phase Noise Analyzer Download
AN4941 - Option IR and STD for the 53100A Phase Noise Analyzer Download
53100A Phase Noise Analyzer Data Sheet Download
53100A Phase Noise Analyzer User's Guide Download
53100A TimeLab Software Download