53100A | Microchip Technology

53100A Phase Noise Analyzer

53100A

Status: In Production
200MHz, 4 Channel. Cross correlation test set

Overview

  • Allan deviation (ADEV) typically less than 5E-15 at t=1s, 1E-16 at t=1000s
  • Measure up to 3 devices simultaneously
  • Close-to-carrier Phase noise and AM noise at offsets from 0.001 Hz
  • Single or dual reference oscillator inputs allow cross-correlation measurements with noise floor approaching -175dBc/Hz
  • Modified Allan deviation (MDEV), Hadamard deviation (HDEV), and time deviation (TDEV), jitter, residual FM, and SSB carrier/noise ratio
  • Independent input and reference frequencies from 1 to 200 MHz
  • No phase-locking or measurement calibration required
  • Designed to measure the amplitude, phase and frequency stability of high-performance RF sources, the 53100A tells you everything you need to know about the stability characteristics of your devices, at timescales ranging from femtoseconds to days. From use on a bench-top or embedded into rack-mount ATE systems, the small formfactor and industry-leading measurement speed makes this test set versatile for multiple applications.
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