Allan deviation (ADEV) typically less than 5E-15 at t=1s, 1E-16 at t=1000s
Measure up to 3 devices simultaneously
Close-to-carrier Phase noise and AM noise at offsets from 0.001 Hz
Single or dual reference oscillator inputs allow cross-correlation measurements with noise floor approaching -175dBc/Hz
Modified Allan deviation (MDEV), Hadamard deviation (HDEV), and time deviation (TDEV), jitter, residual FM, and SSB carrier/noise ratio
Independent input and reference frequencies from 1 to 200 MHz
No phase-locking or measurement calibration required
Designed to measure the amplitude, phase and frequency stability of high-performance RF sources, the 53100A tells you everything you need to know about the stability characteristics of your devices, at timescales ranging from femtoseconds to days. From use on a bench-top or embedded into rack-mount ATE systems, the small formfactor and industry-leading measurement speed makes this test set versatile for multiple applications.
Please visit the full parametric chart. If you still cannot find the
chart you are looking for, please complete our
Website
Feedback Form
to notify us of this issue.