We detect you are using an unsupported browser. For the best experience, please visit the site using Chrome, Firefox, Safari, or Edge. X
Maximize Your Experience: Reap the Personalized Advantages by Completing Your Profile to Its Fullest. Update Here
Stay in the loop with the latest from Microchip. Update your profile while you are at it. Update Here
Complete your profile to access more resources. Update Here
Cross-reference search

EEPROM Triple Test

Triple Test Advantages

Field failures hurt everyone. Reduce them today with our triple-tested parts. Here are some reasons why you should choose our EEPROMs:

  • Market-leading product line in both densities and breadth of package options
  • Parts stay in the field longer because of their exceptional endurance
  • Backed by our customer-driven obsolescence practice of continuing to supply a product for as long as possible while demand for the product exists
  • Special offering include serial numbers, tracking numbers, two-pin, four-pin, MAC addresses and other options 

EEPROM Triple Test

Our lab tests show some surprising results on EEPROM lasting quality. This three-minute video discusses the results.

Why Our Parts Are Better

Test 1: First Wafer Probe

  • Every die receives 100% AC/DC testing of all data sheet parameters
    at 85°C or 125°C
  • All bits are erased and written up to 5000 times to weed out any failures

Test 2: Second Wafer Probe

  • Every die is compared to its own first wafer probe results
  • Other part mortality testing is added to further eliminate field failures

High-Temperature Retention Bake

  • Every sorted wafer undergoes a 5- to 24-hour retention bake at 250°C

Test 3: Final Test

  • Final packaged product testing verifies data sheet compliance

EEPROM Triple Test

Our lab results show our testing creates the industry’s best EEPROM products.

Explore Products

Live Chat

Need Help?

Privacy Policy